Direct detection of electron backscatter diffraction patterns.
Direct detection of electron backscatter diffraction patterns.
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直接检测电子背散射衍射图案。
DOI：
10.1103/physrevlett.111.065506
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发表时间：
2013
影响因子：
8.6
通讯作者：
Wilkinson AJ
中科院分区：
文献类型：
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作者：
Wilkinson AJ
我们报告的第一次使用直接检测记录电子背散射衍射图案。我们证明了以下优点的直接检测：在图案中的分辨率是这样的，更高阶的功能是可见的;图案可以记录在低于那些传统的探测器有效地操作的光束能量;高精度的互相关为基础的图案偏移测量所需的高分辨率电子背散射衍射应变映射可以获得。我们还表明，直接检测的物理基础是足够好地理解在低初级电子能量，这样可以生成模拟图案，以验证我们的实验数据。
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern shift measurements needed for high resolution electron backscatter diffraction strain mapping can be obtained. We also show that the physics underlying direct detection is sufficiently well understood at low primary electron energies such that simulated patterns can be generated to verify our experimental data.