Structure and dielectric properties of NdxSr1−xTiO3 ceramics for energy storage application
Structure and dielectric properties of NdxSr1−xTiO3 ceramics for energy storage application
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DOI：
10.1007/s10854-012-0798-2
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发表时间：
2012-06
期刊：
影响因子：
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通讯作者：
Z. Shen;Yueming Li;W. Luo;Zhumei Wang;X. Gu;R. Liao
中科院分区：
文献类型：
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作者：
Z. Shen;Yueming Li;W. Luo;Zhumei Wang;X. Gu;R. Liao
采用固相反应法制备了配方为NdxSr1−xTiO3（NSTO,x= 0, 0.024, 0.056, 0.104, 0.152, 0.200）的掺钕srtio3多晶陶瓷。x射线衍射（XRD）分析证实了单相化合物的形成，并表明随着Nd掺杂浓度的增加，结构由立方变为四方。扫描电镜观察到，当x= 0.024时，未掺杂srtio3陶瓷的晶粒尺寸从~30 μm减小到~1 μm。随着Nd掺杂浓度的进一步增加，晶粒尺寸逐渐增大，当x值为0.200时晶粒尺寸达到~3 μm。在1 kHz环境温度下测量了NSTO陶瓷的介电性能。结果表明，Nd的掺杂使烧结样品的介电常数显著增加，当x= 0.104时，介电常数达到最大值19,800。所有掺nd的srtio3样品击穿强度均大于10 kV/mm。初步讨论了三价Nd3+掺杂引起的介电性能与微观结构的关系，以及与电荷补偿相关的缺陷结构。
Polycrystalline Nd-doped SrTiO3ceramics with the formula NdxSr1−xTiO3(NSTO,x= 0, 0.024, 0.056, 0.104, 0.152, 0.200) were prepared by solid state reaction route. X-ray diffraction (XRD) analysis confirmed the formation of monophasic compounds and indicated the structure to be changed from cubic to tetragonal by increasing Nd doping concentrations. A remarkable decrease in grain size from ~30 μm for un-doped SrTiO3ceramics to ~1 μm for Nd-doped SrTiO3ceramics withx= 0.024 was observed by scanning electron microscopy. The grain size had a degree of increasing with further increasing Nd doping concentration and reached ~3 μm when thexvalue was 0.200. The dielectric properties of NSTO ceramics were measured at 1 kHz in ambient temperature. It revealed that the dielectric constant dramatically increases for the reason of Nd doping, leading to a maximum value of 19,800 for as-sintered sample withx= 0.104. The breakdown strength of all Nd-doped SrTiO3samples was found to be higher than 10 kV/mm. The relationship between dielectric properties and the microstructure feature, as well as the defect structures correlated with the charge compensation induced by trivalent Nd3+doping, was discussed tentatively.