An X-ray diffraction study of the SrBrxI2−x system
An X-ray diffraction study of the SrBrxI2−x system
复制标题
SrBrxI2−x 系统的 X 射线衍射研究
DOI：
10.1016/0022-4596(83)90155-x
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发表时间：
1983
期刊：
影响因子：
--
通讯作者：
H. Eick
中科院分区：
文献类型：
--
作者：
S. Hodorowicz;H. Eick
混合卤素相SrBrxI 2 −x（2.00 >x> 0）的制备方法是在密封的真空石英安瓿中加热称量的纯SrBr 2和SrI 2，以及在无水乙醇中共结晶。用X射线粉末衍射法对反应产物进行了分析。在相图中观察到五个不同的区域。给出了单相区SrBr 2 <$SrBr 1.60I0.40、SrBr 1.40I0.60 <$SrBr 0.80I1.20和SrBr 0.30I1.70 <$SrI2的晶体学特征，并根据X射线粉末衍射强度推断了晶体结构中的阴离子分布。
The mixed halogen phases SrBrxI2−x, for which 2.00 >x> 0 were prepared both by heating weighed masses of pure SrBr2and SrI2in sealed evacuated quartz ampoules and by cocrystallization from absolute ethanol. The reaction products were examined by X-ray powder diffraction methods. Five distinct regions were observed in the phase diagram. The crystallographic characteristics of phases representative of the single phase regions, SrBr2SrBr1.60I0.40, SrBr1.40I0.60SrBr0.80I1.20, and SrBr0.30I1.70SrI2, are presented, and the anion distributions in the crystal structures are deduced on the basis of X-ray powder diffraction intensities.