Electrostatically Induced Voltage Generated in "Metal Boxes with Different Volume" Measured by Spark Gap and Electromagnetic Wave Sensor
Electrostatically Induced Voltage Generated in "Metal Boxes with Different Volume" Measured by Spark Gap and Electromagnetic Wave Sensor
复制标题
DOI：
10.1109/tdei.2011.6032813
复制
发表时间：
2011-10-01
影响因子：
3.1
通讯作者：
Huruta, Yuuki
中科院分区：
文献类型：
--
作者：
Ichikawa, Norimitsu;Huruta, Yuuki
带电体（如带电的人体或带电的设备）的运动常常会引起电子设备的故障或失效，因为在设备的部分打开的金属盒中会产生感应电压。当室内相对湿度因为使用空调而降低时，我们不能忽视这类电子设备的故障。我们需要设计电子设备以安全地防止此类故障。为了电子设备的安全设计，必须测量金属盒中产生的感应电压。我们使用火花间隙和电磁波传感器测量在没有电气连接的金属盒中产生的感应电压。本文研究了感应电压与金属盒体积的关系。实验中使用5个不同深度的金属盒子来改变盒子的体积。测量结果表明，金属盒内产生的感应电压与金属盒的体积（盒的深度）无关。因此，在小金属盒中产生的感应电压值与在大金属盒中产生的感应电压值几乎相同。因此，感应电压可以在小型金属盒中产生，例如平板设备。研究结果可为电子设备的安全设计提供参考，以防止电子设备的故障和失效。
The movement of a charged body, such as a charged human body or a charged device, often causes a malfunction or failure in an electronic apparatus because an induced voltage is generated in a partially opened metal box of the apparatus. We cannot ignore this type of electronic apparatus malfunction when the relative humidity in a room decreases because of the use of an air conditioner. We need to design the electronic apparatus to safely prevent such malfunctions. The induced voltage generated in the metal box must be measured for the safe design of an electronic apparatus. We measure the induced voltage generated in the metal box without electrical connections using a spark gap and an electromagnetic wave sensor. In this paper, we study the relationship between the induced voltages and the volume of the metal boxes. Five metal boxes with different depths are used to vary the volume of the boxes in the experiment. The measured result shows that the induced voltage generated in the metal box is independent of the volume of the metal boxes (the depth of the boxes). Thus, the value of the induced voltage generated in a small metal box is almost the same as that in a big metal box. Therefore, an induced voltage can be generated in a small metal box, such as a tablet device. The result of this study is useful for the safe design of an electronic apparatus to prevent malfunctions and failure of the apparatus.