Explainable AI-infused ultrasonic inspection for internal defect detection
Explainable AI-infused ultrasonic inspection for internal defect detection
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DOI:
10.1016/j.cirp.2022.04.036
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发表时间:
2022-07-12
影响因子:
4.1
通讯作者:
Bukkapatnam, Satish T. S.
中科院分区:
文献类型:
--
作者:
Karthikeyan, Adithyaa;Tiwari, Akash;Bukkapatnam, Satish T. S.
While AI and imaging technologies are dramatically transforming the process and machine condition monitoring, product inspection remains confined to probing the geometry and surface morphology. Subsurface and bulk inspection remain prohibitively slow and imprecise. This paper presents an explainable AI (XAI)-infused ultrasound imaging approach for rapid detection of artifacts including product defects. The approach led to the discovery of correlated spatial patterns in the images located away from the artifacts. This discovery enabled accurate (> 80%) detection of artifacts that are not discernible with the current image segmentation methods, and it could profoundly impact product quality and (cyber)security assurance technologies. (C) 2022 CIRP. Published by Elsevier Ltd. All rights reserved.