H.Motomura, T.Nakamura, K.Tachibana: "Difference in Surface and Gas Phase Reaction between C_4F_8 and C_5F_8 Plasmas for SiO_2/Photo-Resist Selective Etching"Symposium Proceedings of the 15^<th> International Symposium on Plasma Chemistry(ISPC-15). 1719-1

H.Motomura, T.Nakamura, K.Tachibana: "Difference in Surface and Gas Phase Reaction between C_4F_8 and C_5F_8 Plasmas for SiO_2/Photo-Resist Selective Etching"Symposium Proceedings of the 15^<th> International Symposium on Plasma Chemistry(ISPC-15). 1719-1
复制标题

H.Motomura、T.Nakamura、K.Tachibana:“Difference in Surface and Gas Phase Reaction Between C_4F_8 and C_5F_8 Plasmas for SiO_2/Photo-Resist Selective Etching”第十五届国际等离子体化学研讨会(ISPC)会议论文集

DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
--
中科院分区:
--
文献类型:
--
作者:

文献摘要

相似文献