Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture
Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture
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DOI：
10.1109/tcad.2009.2018775
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发表时间：
2009-07
影响因子：
2.9
通讯作者：
D. Xiang;D. Hu;Qiang Xu;A. Orailoglu
中科院分区：
文献类型：
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作者：
D. Xiang;D. Hu;Qiang Xu;A. Orailoglu
提出了一种新的扫描结构，以降低峰值测试功耗和捕获功耗。在任何时钟周期中，只有扫描触发器的子集被激活以移位测试数据或捕获测试响应。这可以有效地降低捕获测试功率和峰值测试功率。提出了两种路由驱动的方案，以减少路由开销。实验结果表明，该扫描结构可以有效地降低峰值测试功耗、捕获功耗、测试数据量和测试应用成本。
A new scan architecture is proposed to reduce peak test power and capture power. Only a subset of scan flip-flops is activated to shift test data or capture test responses in any clock cycle. This can effectively reduce the capture test power and peak test power. Two routing-driven schemes are proposed to reduce the routing overhead. Experimental results show that the proposed scan architecture can effectively reduce peak test power, capture power, test data volume, and test application cost.