Quantum circuit cutting with maximum-likelihood tomography
Quantum circuit cutting with maximum-likelihood tomography
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DOI：
10.1038/s41534-021-00390-6
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发表时间：
2021-04-23
影响因子：
7.6
通讯作者：
Osborn, James C.
中科院分区：
文献类型：
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作者：
Perlin, Michael A.;Saleem, Zain H.;Osborn, James C.
我们引入最大似然碎片断层扫描（MLFT）作为一种改进的电路切割技术，用于在具有有限数量量子位的量子设备上运行集群量子电路。除了最小化电路切割方法的经典计算开销之外，MLFT 还根据从电路片段获得的测量数据，找到量子电路输出最可能的概率分布。我们通过对随机酉电路进行数值实验，证明了 MLFT 在准确估计碎片量子电路输出方面的优势。最后，我们证明电路切割可以以比完整电路执行更高的保真度来估计集群电路的输出，从而推动使用电路切割作为在量子硬件上运行集群电路的标准工具。
We introduce maximum-likelihood fragment tomography (MLFT) as an improved circuit cutting technique for running clustered quantum circuits on quantum devices with a limited number of qubits. In addition to minimizing the classical computing overhead of circuit cutting methods, MLFT finds the most likely probability distribution for the output of a quantum circuit, given the measurement data obtained from the circuit's fragments. We demonstrate the benefits of MLFT for accurately estimating the output of a fragmented quantum circuit with numerical experiments on random unitary circuits. Finally, we show that circuit cutting can estimate the output of a clustered circuit with higher fidelity than full circuit execution, thereby motivating the use of circuit cutting as a standard tool for running clustered circuits on quantum hardware.