Achieving 100% cell-aware coverage by design
Achieving 100% cell-aware coverage by design
复制标题
通过%20设计实现%20100%%20细胞感知%20覆盖%20
DOI：
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发表时间：
2016
期刊：
影响因子：
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通讯作者：
R. D. Blanton
中科院分区：
文献类型：
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作者：
Z. Liu;Ben Niewenhuis;Soumya Mittal;R. D. Blanton
对新集成电路设计和制造技术的全面研究对于生产可靠的部件至关重要。以前的工作提出了一种新的逻辑表征车辆称为卡内基梅隆逻辑表征车辆（CM-LCV），和一个实施流程，确保测试芯片是产品一样的接近最佳的可测试性和可诊断性。这项工作描述了一种增强的实施方法CM-LCV，不仅保证100%的单元内缺陷可测性的所有标准单元，但也反映了用户指定的设计特性。比较CM-LCV和各种基准电路之间的单元内缺陷可测性的实验证明了这种方法的有效性。具体而言，CM-LCV实现92.4%的整体输入模式的故障覆盖率和100%的细胞知道的故障覆盖率使用最佳的，最小的测试集。
A comprehensive investigation of new integrated circuit design and fabrication technologies is crucial for yielding reliable parts. Prior work proposed a novel logic characterization vehicle called the Carnegie Mellon Logic Characterization Vehicle (CM-LCV), and an implementation flow that ensures a test chip to be product-like with near optimal testability and diagnosability. This work describes an enhanced implementation methodology for CM-LCV that not only guarantees 100% intra-cell defect testability for all standard cells but also reflects the user-specified design characteristics. Experiments comparing intra-cell defect testability between a CM-LCV and various benchmark circuits demonstrate the efficacy of this approach. Specifically, the CM-LCV achieves 92.4% overall input pattern fault coverage and 100% cell-aware fault coverage using an optimal, minimal test set.