Investigation of the Failure Mechanism for an S-Band Pillbox Output Window Applied in High-Average-Power Klystrons
Investigation of the Failure Mechanism for an S-Band Pillbox Output Window Applied in High-Average-Power Klystrons
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DOI：
10.1109/ted.2010.2041874
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发表时间：
2010-03
影响因子：
3.1
通讯作者：
Fang Zhu;Zhaochuan Zhang;Ji-run Luo;Yuwen Zhang
中科院分区：
文献类型：
--
作者：
Fang Zhu;Zhaochuan Zhang;Ji-run Luo;Yuwen Zhang
在X射线光电子能谱、理论分析和数值模拟结果的基础上，讨论了用于高平均功率速调管的S带输出窗的失效机理。研究了高阶圆柱形导模对微波功率损耗、功率流向和窗口盘裂纹的影响。窗口陶瓷盘表面存在的高阶圆柱导TM11模可能会导致碳膜沉积和盘上过大的射频损耗，导致窗口击穿。
On the basis of the results of X-ray photoelectron spectroscopy, theoretical analyses, and numerical simulations, the failure mechanism of an S-band pillbox output window applied in a high-average-power klystron is discussed. The influence of the high-order cylindrical-guide modes on the microwave power loss, the direction of the power flow and the window disk cracking are investigated. The high-order cylindrical-guide TM11 mode existing on the surface of the window ceramic disk may cause the carbon film deposition and excessive radio frequency losses on the disk and lead to the breakdown of the window.