Measurement of strain and strain relaxation in free-standing Si membranes by convergent beam electron diffraction and finite element method

Measurement of strain and strain relaxation in free-standing Si membranes by convergent beam electron diffraction and finite element method
复制标题

通过会聚束电子衍射和有限元法测量自支撑硅膜的应变和应变弛豫

DOI:
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发表时间:
2011
期刊:
影响因子:
9.4
通讯作者:
H.Nakashima
H.Nakashima
中科院分区:
材料科学1区
文献类型:
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作者:
H.Gao;K.Ikeda;S.Hata;H.Nakashima;D.Wang;H.Nakashima

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