A METHOD FOR CONVERTING EXPERIMENTAL X-RAY INTENSITIES TO AN ABSOLUTE SCALE

A METHOD FOR CONVERTING EXPERIMENTAL X-RAY INTENSITIES TO AN ABSOLUTE SCALE
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DOI:
10.1107/s0365110x56002655
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发表时间:
1956-01-01
期刊:
ACTA CRYSTALLOGRAPHICA
影响因子:
--
通讯作者:
KROGHMOE, J
KROGHMOE, J
中科院分区:
其他
文献类型:
--
作者:
KROGHMOE, J

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导出了样品密度与散射X射线强度积分之间的关系。这个关系式被证明对于将实验X射线强度调整到一个绝对尺度是有用的。在几乎所有的X射线工作中,散射强度都是在任意的相对尺度上观察到的。通常希望获得绝对尺度上的强度。对于X射线非晶散射体,这通常是通过假设在大散射角下观察到的强度收敛于原子形状因子的平方和和非相干散射来实现的。这种方法不是很令人满意,因为它需要精确测量大角度的低强度散射。此外,
A relationship between the density of a sample and an integral over the scattered X-ray intensity is derived. The relationship is shown to be useful in adjusting experimental X-ray intensities to an absolute scale.In nearly all X-ray work the scattered intensity is observed on an arbitrary relative scale. It is often desirable to obtain the intensities on an absolute scale. In the case of an X-ray amorphous scatterer, this has usually been done by assuming that the observed in-tensity converges at large scattering angles to the sum of the squares of the atomic form factors and inco-herent scattering. This procedure is not quite satis-factory, as it requires accurate measurements of the low intensity scattered at large angles. In addition,