Accuracy of microwave cavity perturbation measurements

Accuracy of microwave cavity perturbation measurements
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DOI:
10.1109/22.920149
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发表时间:
2001-05-01
影响因子:
4.3
通讯作者:
Carter, RG
Carter, RG
中科院分区:
工程技术1区
文献类型:
--
作者:
Carter, RG

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基于腔谐振腔微扰的测量技术通常用于测量介质和铁氧体材料样品在微波频率下的介电常数和磁导率,也用于测量微波结构中的局部电场和磁场强度,包括腔谐振器的并联阻抗和慢波结构的耦合阻抗。本文重新检验了这些技术的理论假设,并给出了测量误差的估计。
Techniques based on the perturbation of cavity resonators are commonly used to measure the permittivity and permeability of samples of dielectric and ferrite materials at microwave frequencies, They are also used to measure the local electric- and magnetic-field strengths in microwave structures including the shunt impedances of cavity resonators and the coupling impedances of slow-wave structures, This paper reexamines the assumptions made in the theory of these techniques and provides estimates of the errors of measurement arising from them.