Comparative Study of Metalorganic Chemical Vapour Deposition of HfO_2 and Al_2O_3 Gate Insulators on SiC for Power MOSFET Applications
Comparative Study of Metalorganic Chemical Vapour Deposition of HfO_2 and Al_2O_3 Gate Insulators on SiC for Power MOSFET Applications
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用于功率MOSFET应用的SiC上金属有机化学气相沉积HfO_2和Al_2O_3栅极绝缘体的比较研究
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发表时间:
2012
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通讯作者:
Hiroaki Sumitani and Tatsuo Oomori
中科院分区:
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作者:
Eisuke Tokumitsu;Isahaya Yamamura;Shiro Hino;Naruhisa Miura;Masayuki Imaizumi;Hiroaki Sumitani and Tatsuo Oomori