Quantification of SOFC anode microstructure based on dual beam FIB-SEM technique
Quantification of SOFC anode microstructure based on dual beam FIB-SEM technique
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DOI：
10.1016/j.jpowsour.2009.09.005
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发表时间：
2010-02-15
影响因子：
9.2
通讯作者：
Yoshida, Hideo
中科院分区：
文献类型：
--
作者：
Iwai, Hiroshi;Shikazono, Naoki;Yoshida, Hideo
利用配备能量色散X射线能谱(EDX)装置的双束聚焦离子束扫描电子显微镜(FIB-SEM)系统对SOFC阳极的三维微结构进行了定量研究。利用获得的一系列二维扫描电子显微镜图像，在计算场中对Ni-YSZ阳极的微观结构进行了虚拟重建。通过对每个参数应用两种不同的评估方法，仔细评估了三相边界(TPB)密度和曲折因子。TPB密度由体积膨胀法和质心法估计，曲折因子由随机游动计算和格子Boltzmann方法(LBM)估计。两种方法得到的各参数估计值吻合较好，从而验证了本研究提出的分析方法的可靠性。(C)2009爱思唯尔B.V.保留所有权利。
The three-dimensional microstructure of an SOFC anode is quantified using a dual beam focused ion beam scanning electron microscopy (FIB-SEM) system equipped with an energy dispersive X-ray spectroscopy (EDX) unit. The microstructure of the Ni-YSZ anode is virtually reconstructed in a computational field using a series of acquired two-dimensional SEM images. The three-phase boundary (TPB) density and tortuosity factors are carefully evaluated by applying two different evaluation methods to each parameter. The TPB density is estimated by a volume expansion method and a centroid method, while the tortuosity factors are evaluated by a random walk calculation and a lattice Boltzmann method (LBM). Estimates of each parameter obtained by the two methods are in good agreement with each other, thereby validating the reliability of the analysis methods proposed in this study. (C) 2009 Elsevier B.V. All rights reserved.