Inelastic mean free path of photoelectrons in Ag determined by total reflection X-ray photoelectron spectroscopy
Inelastic mean free path of photoelectrons in Ag determined by total reflection X-ray photoelectron spectroscopy
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DOI：
10.2116/analsci.13.797
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发表时间：
1997-10-01
影响因子：
1.6
通讯作者：
Gohshi, Y
中科院分区：
文献类型：
--
作者：
Kawai, J;Adachi, H;Gohshi, Y
当激发的 X 射线以掠射角照射到 Ag 表面时，测量了 X 射线光电子能谱。当入射X射线被全反射时，由于固体中的电子非弹性散射而产生的光谱背景比当X射线未被全反射时更低。我们开发了一种新方法来估计电子非弹性平均自由程（IMFP）。根据全反射X射线光电子能谱背景的折减系数，对于Ag中的1630 eV动能电子，IMFP估计为1.00 nm，这是通常接受的长度的一半。
X-Ray photoelectron spectra were measured when the excited X-rays were impinged on a Ag surface with a grazing angle. The spectral backgrounds owing to the electron inelastic scattering in solids were lower when the incident X-rays were totally reflected than when the X-rays were not totally reflected. We developed a new method to estimate the electron inelastic mean free path (IMFP). The IMFP was estimated to be 1.00 nm, which was one half of the usually accepted length, for 1630 eV kinetic energy electrons in Ag from the reduction factor of the backgrounds of the total reflection X-ray photoelectron spectra.