Enhanced extraction via surface asperities of light generated around the boundary plane in poly (ethylene naphthalate)
Enhanced extraction via surface asperities of light generated around the boundary plane in poly (ethylene naphthalate)
复制标题
通过聚萘二甲酸乙二醇酯边界平面周围产生的光的表面粗糙度增强提取
DOI：
10.1088/1402-4896/abae1d
复制
发表时间：
2020
期刊：
影响因子：
2.9
通讯作者：
Kanayama Masaya
中科院分区：
文献类型：
--
作者：
Nakamura Hidehito;Mori Kazuhiro;Sato Nobuhiro;Kamata Takashi;Kanayama Masaya
聚萘二甲酸乙二酯（PEN）在辐射安全领域的应用具有很大的吸引力。然而，为了核电反应堆的工作人员安全，需要进一步增强未掺杂的闪烁材料用于α粒子探测。在这里，我们表明，从PEN的最大光提取的限制，可以解除通过控制其表面条件。具体地，检查具有各种程度的表面粗糙度的1mm厚的PEN板。发射光谱和透射光谱表明，产生的光的发射波长的影响不大，但大的传播方向的影响。这些特性使放射性污染检查设备中的短程α粒子具有出色的仪器效率，这些设备采用了具有数十μm深表面划痕的PEN。我们模拟表面粗糙度和仪器效率之间的关系，α粒子的表面条件与扫描电子显微镜成像。表面粗糙度导致在表面边界平面周围产生的光的临界角的准减小，这然后导致在平面处的全内反射的增加。这一知识应引起人们对PEN用于放射性管理器械的普遍兴趣。
Applications of poly (ethylene naphthalate)(PEN) in radiation safety are attractive. However, for worker safety at nuclear power reactors, further enhancements of undoped scintillation materials are required for alpha particle detection. Here, we show that restrictions on the maximum light extraction from PEN can be lifted by controlling its surface conditions. Specifically, 1 mm-thick PEN plates with various degrees of surface asperities were examined. Emission and transmission spectra indicated little effect on the emission wavelengths of the generated light, but large effect on the propagation directions. These features resulted in excellent instrument efficiency for short-range alpha particles in radioactive contamination inspection devices that incorporated PEN having several tens of μm deep surface scratches. We modelled the relationship between surface asperities and instrument efficiencies for alpha particles by imaging the surface conditions with scanning electron microscopy. Surface asperities led to a quasi-decrease in the critical angle of the light generated around the surface boundary plane, which then resulted in an increase in total internal reflections at the plane. This knowledge should initiate general interest in PEN for radiological management devices.