The Rietveld method
The Rietveld method
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DOI：
10.1107/97809553602060000614
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发表时间：
2006
影响因子：
1.5
通讯作者：
A. Albinati;B. T. M. Willis
中科院分区：
文献类型：
--
作者：
A. Albinati;B. T. M. Willis
Rietveld方法介绍1.早期：回顾性的观点2。Rietveld精化的数学方面3.多晶材料4中的辐射流。数据收集策略：使实验符合需要5。Rietveld分析中的背景建模6. Rietveld分析中X射线粉末衍射图谱的分析图谱拟合7. Rietveld方法中的晶体缺陷加宽和峰形8. X射线粉末衍射图中的布拉格反射轮廓形状9. Rietveld精化中的约束和限制10.脉冲中子源飞行时间粉末衍射数据的Rietveld精化11.综合X射线和中子Rietveld精修12. Rietveld分析程序Rietan和Premos和特殊应用13.位置约束和无约束粉末图案分解方法14.从头算结构解与粉末衍射数据
Introduction to the Rietveld Method 1. The early days: a retrospective view 2. Mathematical aspects of Rietveld refinement 3. The flow of radiation in a polycrystalline material 4. Data collection strategies: fitting the experiment to the need 5. Background modelling in Rietveld analysis 6. Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis 7. Crystal imperfection broadening and peak shape in the Rietveld method 8. Bragg reflection profile shape in X-ray powder diffraction patterns 9. Restraints and constraints in Rietveld refinement 10. Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources 11. Combined X-ray and neutron Rietveld refinement 12. Rietveld analysis programs Rietan and Premos and special applications 13. Position - constrained and unconstrained powder-pattern-decomposition methods 14. Ab initio structure solutions with powder diffraction data