Extraction methods of phase information for X-ray diffraction enhanced imaging
Extraction methods of phase information for X-ray diffraction enhanced imaging
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DOI：
10.1016/j.nima.2007.04.043
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发表时间：
2007-08-21
影响因子：
1.4
通讯作者：
Yang, Yigang
中科院分区：
文献类型：
--
作者：
Huang, Zhifeng;Kang, Kejun;Yang, Yigang
X射线衍射增强成像（DEI）是X射线相衬成像方法中的一种，主要用于弱吸收低Z样品内部结构的检测。DEI的关键问题是如何从分析仪摇摆曲线上不同位置测得的一系列DEI图像中提取出以折射角图像表示的相位信息。本文提出了三种有效的提取方法：统计几何光学近似法、最大折射角法和高斯曲线拟合法。并与现有的D. Chapman几何光学近似法和多重象统计法。通过二维计算机仿真实验对这些方法进行了比较。实验结果表明，这三种方法比现有方法具有更高的折射角测量精度。(C)2007 Elsevier B.V.保留所有权利。
X-ray diffraction enhanced imaging (DEI) is one of X-ray phase-contrast imaging methods, which is applied to inspect internal structures of weakly absorbing low-Z samples. The key problem of the DEI is how to extract phase information which is expressed by refraction-angle images from a series of DEI images measured in different positions of the rocking curve of the analyzer. Three effective extraction methods are presented in this paper: the statistical geometric-optics-approximation method, the maximum refraction-angle method and the Gaussian curve fitting method. They are compared with the existing methods, such as the D. Chapman's geometric optics approximation method and the multiple-images statistical method. A 2D computer simulation experiment is performed to draw comparisons of these methods. The experimental results prove that the above three methods have more precision of refraction-angle values than existing methods. (C) 2007 Elsevier B.V. All rights reserved.