PSP-based compact FinFET model describing dc and RF measurements
PSP-based compact FinFET model describing dc and RF measurements
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基于 PSP 的紧凑型 FinFET 模型描述直流和射频测量
DOI:
10.1109/iedm.2006.346990
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发表时间:
2006
期刊:
影响因子:
--
通讯作者:
D. Klaassen
中科院分区:
文献类型:
--
作者:
G. Smit;A. Scholten;N. Serra;R. Pijper;R. Van Langevelde;A. Mercha;G. Gildenblat;D. Klaassen
We present a new, PSP-based compact model for symmetric 3-terminal FinFETs with thin undoped or lightly doped body, which is suitable for digital, analog, and RF circuit simulation. The model is surface potential based and is demonstrated to accurately describe both TCAD data and measured FinFET currents, conductances, and capacitances