High P-T transformations of nitrogen to 170 GPa
High P-T transformations of nitrogen to 170 GPa
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DOI：
10.1063/1.2723069
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发表时间：
2007-05-14
影响因子：
4.4
通讯作者：
Hemley, Russell J.
中科院分区：
文献类型：
--
作者：
Gregoryanz, Eugene;Goncharov, Alexander F.;Hemley, Russell J.
X射线衍射和光谱技术被用来表征氮压缩到170 GPa和加热到2500 K以上的稳定和亚稳态转变。X射线衍射数据表明，ε-N（2）经历了两个连续的结构变化，复杂的分子相zeta在62 GPa和一个新发现的kappa在110 GPa。后者在进一步压缩时变成非晶窄禁带半导体，并且如果经受非常高的温度（类似于2000 K），则在150 GPa以上结晶为结晶的N-半导体-N结构（cg-N）。衍射数据表明，过渡到cg-N是伴随着15%的体积减少。(C)2007年，美国物理学会。
X-ray diffraction and optical spectroscopy techniques are used to characterize stable and metastable transformations of nitrogen compressed up to 170 GPa and heated above 2500 K. X-ray diffraction data show that epsilon-N(2) undergoes two successive structural changes to complex molecular phases zeta at 62 GPa and a newly discovered kappa at 110 GPa. The latter becomes an amorphous narrow gap semiconductor on further compression and if subjected to very high temperatures (similar to 2000 K) crystallizes to the crystalline cubic-gauche-N structure (cg-N) above 150 GPa. The diffraction data show that the transition to cg-N is accompanied by 15% volume reduction. (C) 2007 American Institute of Physics.