X-ray fluorescence holography
X-ray fluorescence holography
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DOI：
10.1088/0953-8984/24/9/093201
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发表时间：
2012-03
期刊：
影响因子：
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通讯作者：
K. Hayashi;N. Happo;S. Hosokawa;Wen Hu;T. Matsushita
中科院分区：
文献类型：
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作者：
K. Hayashi;N. Happo;S. Hosokawa;Wen Hu;T. Matsushita
X 射线荧光全息术 (XFH) 是一种原子分辨率全息术方法，它利用荧光原子作为波源或晶体样品内干涉场的监视器。它提供指定元素周围的三维原子图像，在真实空间中的范围可达几纳米。由于这一特性，XFH有望用于中程局部结构分析，这是X射线衍射或X射线吸收精细结构分析无法进行的。在本文中，我们解释了 XFH 的理论，包括双图像问题的解决方案、先进的测量系统以及用于重建原子图像的数据处理。然后，我们简要介绍了该技术最近在形状记忆合金低温相中出现的混合晶体和纳米尺寸团簇的局部晶格畸变分析中的应用。
X-ray fluorescence holography (XFH) is a method of atomic resolution holography which utilizes fluorescing atoms as a wave source or a monitor of the interference field within a crystal sample. It provides three-dimensional atomic images around a specified element and has a range of up to a few nm in real space. Because of this feature, XFH is expected to be used for medium-range local structural analysis, which cannot be performed by x-ray diffraction or x-ray absorption fine structure analysis. In this article, we explain the theory of XFH including solutions to the twin-image problem, an advanced measuring system, and data processing for the reconstruction of atomic images. Then, we briefly introduce our recent applications of this technique to the analysis of local lattice distortions in mixed crystals and nanometer-size clusters appearing in the low-temperature phase of a shape-memory alloy.