Dielectric properties and abnormal C-V characteristics of Ba0.5Sr0.5TiO3-Bi1.5ZnNb1.5O7 composite thin films grown on MgO (001) substrates by pulsed laser deposition
Dielectric properties and abnormal C-V characteristics of Ba0.5Sr0.5TiO3-Bi1.5ZnNb1.5O7 composite thin films grown on MgO (001) substrates by pulsed laser deposition
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DOI:
10.1063/1.2358934
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发表时间:
2006-10
影响因子:
4
通讯作者:
H. Tian;Yu Wang;Danyang Wang;J. Miao;J. Qi;H. Chan;C. Choy
中科院分区:
文献类型:
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作者:
H. Tian;Yu Wang;Danyang Wang;J. Miao;J. Qi;H. Chan;C. Choy
Highly c-axis oriented Ba0.5Sr0.5TiO3-based composite thin films were grown on MgO (001) single-crystal substrates by pulsed laser deposition and the in-plane dielectric properties of the films evaluated. X-ray diffraction characterization revealed a good crystallinity. The dielectric constant and loss were found to be 200 and 0.001–0.007 at room temperature, respectively. The butterfly-shaped C-V characteristic curve evidenced an enhanced in-plane dielectric tunability of >90% in the films at 1MHz under a dc bias field of 0.8MV∕cm. A brief discussion is given on the abnormal C-V curves. Various tunable microwave applications of Ba0.5Sr0.5TiO3–Bi1.5ZnNb1.5O7 composite thin films are expected.