Vectorization with SIMD extensions speeds up reconstruction in electron tomography
Vectorization with SIMD extensions speeds up reconstruction in electron tomography
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DOI：
10.1016/j.jsb.2010.01.008
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发表时间：
2010-06-01
影响因子：
3
通讯作者：
Fernandez, J. J.
中科院分区：
文献类型：
--
作者：
Agulleiro, J. I.;Garzon, E. M.;Fernandez, J. J.
电子断层扫描可以对分子细节的细胞结构进行结构研究。需要进行大型 3D 重建才能满足分辨率要求。计算这些大容量的处理时间可能相当长，因此传统上一直使用高性能计算技术。这项工作提出了一种断层扫描重建的矢量方法，该方法依赖于现代处理器中可用的 SIMD 扩展的开发以及其他单处理器优化技术的结合。根据最常见的重建算法（即 WBP 和 SIRT）的评估，这种方法成功地生成了全分辨率断层图像，并显着减少了处理时间。主要优点源于这样的事实：这种方法可以在标准计算机上运行，不需要专门的硬件，这有利于程序的开发、使用和管理。处理器设计的未来趋势为 3D 电子显微镜领域中处理器 SIMD 扩展的矢量处理提供了绝佳的机会。 (C) 2010 Elsevier Inc. 保留所有权利。
Electron tomography allows structural studies of cellular structures at molecular detail. Large 3D reconstructions are needed to meet the resolution requirements. The processing time to compute these large volumes may be considerable and so, high performance computing techniques have been used traditionally. This work presents a vector approach to tomographic reconstruction that relies on the exploitation of the SIMD extensions available in modern processors in combination to other single processor optimization techniques. This approach succeeds in producing full resolution tomograms with an important reduction in processing time, as evaluated with the most common reconstruction algorithms, namely WBP and SIRT. The main advantage stems from the fact that this approach is to be run on standard computers without the need of specialized hardware, which facilitates the development, use and management of programs. Future trends in processor design open excellent opportunities for vector processing with processor's SIMD extensions in the field of 3D electron microscopy. (C) 2010 Elsevier Inc. All rights reserved.