Digital imaging to simultaneously study device lifetimes of multiple dye-sensitized solar cells
Digital imaging to simultaneously study device lifetimes of multiple dye-sensitized solar cells
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DOI：
10.1039/c7se00015d
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发表时间：
2017-04-01
影响因子：
5.6
通讯作者：
McGettrick, James
中科院分区：
文献类型：
--
作者：
Furnell, Leo;Holliman, Peter J.;McGettrick, James
用数字成像和颜色分析同时研究了多种染料(D35、N719、SQ1和SQ2)的原位降解。用该方法对吸附在二氧化钛薄膜上的N719和方酸染料的空气稳定性进行了研究，数据表明该方法可作为DSC染料和其他太阳能电池组件的快速筛选技术。然后使用D35或N719染料对完整的DSC设备进行了测试，并将这些数据与UV-Vis、IR和XPS光谱、质谱学、TLC和DSC设备性能进行了关联。使用这种方法，同时测试了多达21个样品，确保了一致的样品暴露。液体电解液DSC器件已经在光浸泡下进行了测试，包括第一份使用I-/I-3(-)电解液在开路、短路或负载下运行时测试D35的报告，其中开路时退化最慢。D35寿命数据表明，这种染料在光浸泡约370小时后降解，而不考虑紫外线过滤。作为对照，N719器件还被光浸泡了2500小时以验证成像方法，N719器件的数据证实紫外线过滤对于保护染料和I-3(-)/I-电解液氧化还原对以维持器件寿命至关重要。这些数据显示了设备子组件的颜色强度和/或色调与设备退化之间的直接联系，从而实现了对设备故障机制的“实时”诊断。
In situ degradation of multiple dyes (D35, N719, SQ1 and SQ2) has been investigated simultaneously using digital imaging and colour analysis. The approach has been used to study the air stability of N719 and squaraine dyes adsorbed onto TiO2 films with the data suggesting this method could be used as a rapid screening technique for DSC dyes and other solar cell components. Full DSC devices have then been tested using either D35 or N719 dyes and these data have been correlated with UV-vis, IR and XPS spectroscopy, mass spectrometry, TLC and DSC device performance. Using this method, up to 21 samples have been tested simultaneously ensuring consistent sample exposure. Liquid electrolyte DSC devices have been tested under light soaking including the first report of D35 testing with I-/I-3(-) electrolyte whilst operating at open circuit, short circuit, or under load, with the slowest degradation shown at open circuit. D35 lifetime data suggest that this dye degrades after ca. 370 h light soaking regardless of UV filtering. Control, N719 devices have also been light soaked for 2500 h to verify the imaging method and the N719 device data confirm that UV filtration is essential to protect the dye and I-3(-)/I- electrolyte redox couple to maintain device lifetime. The data show a direct link between the colour intensity and/or hue of device sub-components and device degradation, enabling "real time" diagnosis of device failure mechanisms.