Applying computational geometry techniques for advanced feature analysis in atom probe data
Applying computational geometry techniques for advanced feature analysis in atom probe data
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DOI：
10.1016/j.ultramic.2013.03.004
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发表时间：
2013-09-01
期刊：
影响因子：
2.2
通讯作者：
Cairney, Julie
中科院分区：
文献类型：
--
作者：
Felfer, Peter;Ceguerra, Anna;Cairney, Julie
本文提出了原子探针层析成像数据的特征分析新方法，这些方法在材料表征中有很好的应用。分析工作基于Voronoi子体积和分段线性近似的原理，以及基于到子体积质心的距离(DCOM)的特征描述。基于这些近似所定义的坐标系，给出了两个可以执行的新类型分析的例子。第一种是线状物体(即位错)的分析，既使用代理图又使用线过量图。第二种是InGaAs量子点的界面超额映射。(C)2013 Elsevier B.V.保留所有权利，
In this paper we present new methods for feature analysis in atom probe tomography data that have useful applications in materials characterisation. The analysis works on the principle of Voronoi subvolumes and piecewise linear approximations, and feature delineation based on the distance to the centre of mass of a subvolume (DCOM). Based on the coordinate systems defined by these approximations, two examples are shown of the new types of analyses that can be performed. The first is the analysis of line-like-objects (i.e dislocations) using both proxigrams and line-excess plots. The second is interfacial excess mapping of an InGaAs quantum dot. (C) 2013 Elsevier B.V. All rights reserved,