Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch
Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch
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DOI：
10.1063/1.1686893
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发表时间：
2004-03-15
影响因子：
4
通讯作者：
Gurney, BA
中科院分区：
文献类型：
--
作者：
Lacour, D;Katine, JA;Gurney, BA
通过两种方式探测由亚微米缺口捕获的畴壁的存在：通过电子输运测量和磁力显微镜（MFM）。MFM数据，表现出复杂的磁功能，是一致的数值模拟预测的存在下，多个磁配置稳定在缺口。通过改变MFM的扫描历史，我们证明了实验上存在多个稳定的位置的畴壁被困在一个亚微米缺口。(C)2004年，美国物理学会。
The presence of a domain wall trapped by a submicron notch is probed in two ways: through electronic transport measurements and by magnetic force microscopy (MFM). MFM data, exhibiting complex magnetic features, are consistent with numerical simulations predicting the existence of multiple magnetic configurations stabilized at the notch. By changing the MFM scanning history we demonstrate experimentally the existence of multiple stable locations for a domain wall trapped by a submicron notch. (C) 2004 American Institute of Physics.