X-ray imaging microscopy using Fresnel zone plate objective and quasimonochromatic undulator radiation
X-ray imaging microscopy using Fresnel zone plate objective and quasimonochromatic undulator radiation
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DOI：
10.1063/1.1669118
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发表时间：
2004-03
影响因子：
1.6
通讯作者：
Yoshio Suzuki;A. Takeuchi;H. Takano;K. Uesugi;T. Oka;Katsuaki Inoue
中科院分区：
文献类型：
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作者：
Yoshio Suzuki;A. Takeuchi;H. Takano;K. Uesugi;T. Oka;Katsuaki Inoue
在SPring-8的波荡器束线40 XU上进行了硬X射线区域的成像显微镜实验。BL 40 XU的螺旋波荡器提供了8.34 keV带宽为1.2%的准单色辐射。使用最外波带宽度为0.25 μm、菲涅耳波带数为100的菲涅耳波带片作为物镜。BL 40 XU波荡器辐射的自然带宽几乎等于波带片物镜所需的单色性。因此，与传统的晶体单色器光束线相比，可用的光子通量高出两个数量级。在8.34keV的X射线能量和1.5ms的曝光时间下，清晰地观察到了0.25 μm线间距的测试图形的精细结构。
An imaging microscopy experiment in a hard x-ray region has been performed at the undulator beamline 40XU of SPring-8. The helical undulator at the BL40XU provides quasimonochromatic radiation with a bandwidth of 1.2% at 8.34 keV. A Fresnel zone plate with an outermost zone width of 0.25 μm and a Fresnel zone number of 100 is used as an objective. The natural bandwidth of the undulator radiation of BL40XU is nearly equal to the monochromaticity required for the zone plate objective. Therefore, compared with conventional beamlines with a crystal monochromator, the available photon flux is higher by two orders. Fine structure of test patterns with 0.25 μm line and space was clearly observed at an x-ray energy of 8.34 keV within an exposure time of 1.5 ms.