Importance of charge capture in interphase regions during readout of charge-coupled devices
Importance of charge capture in interphase regions during readout of charge-coupled devices
复制标题
电荷耦合器件读出期间相间区域电荷捕获的重要性
DOI:
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发表时间:
2018
期刊:
影响因子:
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通讯作者:
A. Holland
中科院分区:
文献类型:
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作者:
J. Skottfelt;D. Hall;B. Dryer;N. Bush;J. Gow;A. Holland
Abstract. The current understanding of charge transfer dynamics in charge-coupled devices (CCDs) is that charge is moved so quickly from one phase to the next in a clocking sequence and with a density so low that trapping of charge in the interphase regions is negligible. However, simulation capabilities developed at the Centre for Electronic Imaging, which includes direct input of electron density simulations, have made it possible to investigate this assumption further. As part of the radiation testing campaign of the Euclid CCD273 devices, data have been obtained using the trap pumping method, a method that can be used to identify and characterize single defects within CCDs. Combining these data with simulations, we find that trapping during the transfer of charge among phases is indeed necessary to explain the results of the data analysis. This result could influence not only trap pumping theory and how trap pumping should be performed but also how a radiation-damaged CCD is readout in the most optimal way.
DOI:
10.1117/12.2024839
发表时间:
2013
期刊:
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影响因子:
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作者:
Murray N
通讯作者:
Murray N
DOI:
10.1117/12.925980
发表时间:
2012
期刊:
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影响因子:
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作者:
Gow J
通讯作者:
Gow J