Self-checking sequential circuit design using m-out-of-n codes
Self-checking sequential circuit design using m-out-of-n codes
复制标题
使用 m-out-of-n 代码的自检时序电路设计
DOI:
10.1049/el:19930005
复制
发表时间:
1993
影响因子:
1.1
通讯作者:
P. Lala
中科院分区:
文献类型:
--
作者:
F. Busaba;P. Lala
A technique for designing sequential circuits which are totally self-checking for single stuck at faults is presented. This technique uses m-out-of-n codes for state assignements and for output encoding. The next stage logic and the output logic arc implemented such that any stuck-at fault will either create a single bit error or unidirectional multibit error at the output. The technique has been applied to MCNC bench-mark circuits and the overhead is estimated