Measurement of the coherence length of highly collimated X‐rays from the visibility of equal‐thickness fringes

Measurement of the coherence length of highly collimated X‐rays from the visibility of equal‐thickness fringes
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从等厚条纹可见度测量高度准直X射线的相干长度

DOI:
10.1107/s010876738800234x
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发表时间:
1988
期刊:
Acta Crystallographica Section A
影响因子:
--
通讯作者:
T. Ishikawa
T. Ishikawa
中科院分区:
--
文献类型:
--
作者:
T. Ishikawa

文献摘要

被引文献

相似文献

首次根据劳厄几何中等厚条纹的可见性确定了准直器系统使用连续不对称反射产生的高度准直 X 射线的相干长度。在 0.70 A 波长下,观察到的相干长度的横向和纵向分量分别超过 220 和 40 μm。
The coherence length of highly collimated X-rays produced by a collimator system, using successive asymmetric reflections, has been determined for the first time from the visibility of equal-thickness fringes in the Laue geometry. Observed transverse and longitudinal components of the coherent length were more than 220 and 40 μm, respectively, at a wavelength of 0.70 A.