Space resolved microstructural characteristics in the chip formation zone of orthogonal cut C45E steel samples characterized by diffraction experiments
Space resolved microstructural characteristics in the chip formation zone of orthogonal cut C45E steel samples characterized by diffraction experiments
复制标题
通过衍射实验表征正交切割 C45E 钢样品切屑形成区的空间分辨微观结构特征
DOI：
10.1016/j.jmatprotec.2013.06.016
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发表时间：
2013
影响因子：
6.3
通讯作者：
Reimers
中科院分区：
文献类型：
--
作者：
Brömmelhoff;Gerstenberger;Fischer;Schell;Uhlmann;Reimers
利用高能同步辐射X射线对C45 E钢进行了正交切削的衍射实验。通过在切屑形成区的不同测量位置处的积分X射线峰强度和半高宽（FWHMs）的演变来分析微观结构的发展。测量位置选择在主剪切区和次剪切区周围以及切削刃后面，以表示具有不同变形程度的位置。结果进行了比较，从光学显微镜观察芯片根样品。在切屑形成过程中观察到依赖于测量位置的微观结构的强烈变化，即畴尺寸的强烈减小和导致bcc剪切织构的重取向，其用理想织构（1 1 0）[0 0 1]和（1 1 2 <$）[1 1 1]描述。通过光学显微镜测定的剪切方向可以与在110 X射线极图中观察到的剪切方向一致。
Diffraction experiments with high energy synchrotron X-radiation were performed during orthogonal cutting of the steel C45E. The development of the microstructure was analysed by means of the evolution of integral X-ray peak intensities and FWHMs (Full Width at Half Maxima) at different measuring positions in the chip formation zone. Measuring positions were chosen around the primary and secondary shear zones and behind the cutting edge, to represent positions with a different degree of deformation. The results were compared to observations made from optical microscopy on the chip root samples. A strong change of the microstructure was observed during chip formation in dependence on the measuring position, namely a strong reduction of domain sizes and a reorientation which results in a bcc shear texture, which is described with the ideal textures (1 1 0)[0 0 1] and (1 1 2¯)[1 1 1]. The shear direction determined by optical microscopy could be brought into agreement with the shear direction observed in the 1 1 0 X-ray pole figure.