Density and atomic number measurements with spectral x-ray attenuation method
Density and atomic number measurements with spectral x-ray attenuation method
复制标题
DOI:
10.1063/1.1586963
复制
发表时间:
2003-08-01
影响因子:
3.2
通讯作者:
Stierstorfer, K
中科院分区:
文献类型:
--
作者:
Heismann, BJ;Leppert, J;Stierstorfer, K
X-ray attenuation measurements are widely used in medical and industrial applications. The usual results are one- to three-dimensional representations of the attenuation coefficient mu(r). In this paper, we present the rhoZ projection algorithm for obtaining the density rho(r) and atomic number Z(r) with an energy-resolving x-ray method. As input data the algorithm uses at least two measurements mu(1), mu2,... with different spectral weightings of the source spectrum S(E) and/or detector sensitivity D(E). Analytically, rho is a function of mu(1)-cmu(2), c = const, and Z is a function of mu(1)/mu(2). The full numerical treatment yields rho(mu(1), mu(2)) and Z(mu(1), mu(2)) with S(E) and D(E) as commutative parametric functions. We tested the method with dual-energy computed tomography measurements of an organic sample and a set of chemical solutions with predefined rho and Z. The resulting images show rho and Z as complementary information: The density rho reflects the morphology of the objects, whereas the atomic number Z = number of electrons/atom describes the material distribution. For our experimental setup we obtain an absolute precision of 0.1 for Z and 20 mg/cm(3) for rho. The rhoZ projection can potentially lead to these classes of quantitative information for various scientific, industrial, and medical applications. (C) 2003 American Institute of Physics.