Towards real-time testing of clocked Quantum Dot Cellular Automata
Towards real-time testing of clocked Quantum Dot Cellular Automata
复制标题
致力于时钟量子点元胞自动机的实时测试
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
P. Fay
中科院分区：
文献类型：
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作者：
Yong Tang;A. Orlov;G. Snider;P. Fay
我们提出了一种实时测量时钟量子点元胞自动机（QCA）电路中电子开关的方法，即QCA锁存器。采用载频为991.2 MHz的电容耦合射频单电子晶体管（RF-SET）作为读出静电计。SET阻抗的反射模式检测提供了对锁存点电荷配置变化的快速响应。我们演示了一种QCA锁存器，其工作温度高于300毫开尔文，时钟速度为5µs。
We present a real-time measurement of electron switching in clocked Quantum-Dot Cellular Automata (QCA) circuit, a QCA latch. A capacitively coupled radio frequency single electron transistor (RF-SET) with carrier frequency at 991.2 MHz is used as read-out electrometer. Reflection-mode detection of the SET impedance provides a fast response to changes of charge configuration in the latch dots. We demonstrate a QCA latch with operating temperature above 300 milli-Kelvin and clocking speed of 5 µsec.