Development of a tabletop time-of-flight mass spectrometer with an ion attachment ionization technique.

Development of a tabletop time-of-flight mass spectrometer with an ion attachment ionization technique.
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开发具有离子附着电离技术的台式飞行时间质谱仪。

DOI:
10.1002/rcm.3139
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发表时间:
2007
影响因子:
2
通讯作者:
M. Tanimoto
M. Tanimoto
中科院分区:
化学3区
文献类型:
--
作者:
N. Saito;Jyun;Y. Taneda;Y. Shiokawa;M. Tanimoto

文献摘要

被引文献

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我们报道了一种基于飞行时间质谱仪并结合离子附着电离技术(IA - TOF)的新型质谱法。与电子电离质谱不同,IA - TOF质谱不会因分子离子的碎片化而出现复杂的峰;在离子附着电离过程中形成的加合离子不会碎片化。我们开发了一种台式IA - TOF系统,并通过分析原本处于气态、液态和固态的样品来评估其性能。我们获得了无碎片的质谱图,其质量范围可达m/z 3400,质量分辨率约为4700。我们的IA - TOF系统实现了准确且通用的实时质谱分析。
We report a new type of mass spectrometry based on a time-of-flight mass spectrometer combined with an ion attachment ionization technique (IA-TOF). In contrast to electron ionization mass spectra, IA-TOF mass spectra are not complicated by peaks due to fragmentation of the molecular ion; the adduct ion formed in IA does not fragment. We developed a tabletop IA-TOF system and evaluated its performance by analyzing specimens originally in the gas, liquid, and solid phases. We obtained fragment-free spectra covering a mass range up to m/z 3400 with a mass resolution of about 4700. Our IA-TOF system realizes accurate and versatile real-time mass spectrometry.