Design of compactors for signature-analyzers in built-in self-test
Design of compactors for signature-analyzers in built-in self-test
复制标题
内置自检签名分析仪压缩器的设计
DOI：
10.1109/test.2001.966618
复制
发表时间：
2001
期刊：
影响因子：
--
通讯作者：
T. Williams
中科院分区：
文献类型：
--
作者：
P. Wohl;J. Waicukauski;T. Williams
逻辑内置的自我测试（BIST）最初是在几十年前开发的，现在越来越多地采用以应对设计规模和复杂性的快速增长。与确定性模式测试相比，Logic Bist需要更多的测试模式，因此，除非可以并行移动更多的内部扫描链，否则测试时间增加。要匹配这大量的扫描链，必须扩大签名分析仪的宽度，这将导致大面积的头顶和签名存储空间。取而代之的是，在扫描链输出和签名分析仪输入之间插入了组合空间连接器。但是，压实器可能会恶化测试和诊断设计的能力。本文分析了压缩机如何影响测试和诊断，并表明可以设计压实物来实际提高某些故障的可检验性，同时提供完全的诊断能力。提出了允许自动设计的算法，并讨论了结果。
Originally developed decades ago, logic built-in self-test (BIST) evolved and is now increasingly being adopted to cope with rapid growth in design size and complexity. Compared to deterministic pattern test, logic BIST requires many more test patterns, and therefore, increased test time unless many more internal scan chains can be shifted in parallel. To match this large number of scan chains, the width of the signature analyzer would have to be enlarged, which would result in large area overhead and signature storage space. Instead, a combinational space-compactor is inserted between the scan chain outputs and the signature analyzer inputs. However, the compactor may deteriorate the ability to test and diagnose the design. This paper analyzes how compactors affect test and diagnosis and shows that compactors can be designed to actually improve the testability of certain faults, while providing full diagnosis capability. Algorithms that allow automated design of optimal compactors are presented and results are discussed.