Construction of Independently Driven Double-Tip Scanning Tunneling Microscope
Construction of Independently Driven Double-Tip Scanning Tunneling Microscope
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DOI：
10.1143/jjap.44.l120
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发表时间：
2004
影响因子：
1.5
通讯作者：
K. Takami;M. Akai‐Kasaya;A. Saito;M. Aono;Y. Kuwahara
中科院分区：
文献类型：
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作者：
K. Takami;M. Akai‐Kasaya;A. Saito;M. Aono;Y. Kuwahara
我们构建了一个独立驱动的双端扫描隧道显微镜（STM），用于评估环境条件下微米级的电导率。每个独立驱动的 STM 单元都具有原子分辨率，尖端通过三个路线驱动台和最大扫描面积为 10 µm 的压电器件接近表面上 10 mm2 内的预定位置。可以检测到两个尖端之间流经材料的电流，范围为 0.1 pA 至 100 nA。使用该系统演示了区域随机聚（3-辛基噻吩）薄膜电阻率的测量。
We construct an independently driven double-tip scanning tunneling microscope (STM) for evaluating electrical conduction within the micrometer scale under an ambient condition. Each independently driven STM unit has on atomic resolution and the tip approaches an intended position within 10 mm2 on the surface with three course driving stages and a piezoelectric device which has a maximum scan area of 10 µm. The current flow between the two tips through the material can be detected in the range from 0.1 pA to 100 nA. The measurement of the resistivity of regiorandom poly(3-octylthiophene) thin films was demonstrated using this system.