Characterizing the Distribution of Microwave Surface Resistance of HTS Film Based on Metal Ring
Characterizing the Distribution of Microwave Surface Resistance of HTS Film Based on Metal Ring
复制标题
基于金属环的高温超导薄膜微波表面电阻分布表征
DOI：
10.1007/s10948-018-4923-1
复制
发表时间：
2018-11
影响因子：
1.8
通讯作者：
Wang Zhanping
中科院分区：
文献类型：
--
作者：
Zeng Cheng;Chen Liu;Bu Shirong;Ning Junsong;Zhang Qishao;Wang Zhanping
本文提出了一种用带金属环的介质谐振器测量高温超导薄膜微波表面电阻分布的新方法。经校正后，金属环损耗对测量精度的影响可以忽略不计。测量分辨率由金属环的内径决定，这使得装置的设计更加灵活。因此，使用合适尺寸的金属环，在相对较低的频率下工作，可以同时实现高分辨率和便捷性的测量。研制了工作在32 GHz、TE01（1 +δ）模式下的测试装置。它的分辨率是直径为5毫米，面积为19.6平方毫米的圆形区域。试验装置经标定腔加载时，其卸载质量因数大于14万。测试装置的相对不确定度小于6%，符合高温超导（HTS）薄膜微波表面电阻测量国际标准规定的不确定度（20%）。2-in。利用该测试装置对YBCO/LAO/YBCO超导膜样品进行了测试。
This paper presents a novel method for measuring the microwave surface resistance distribution of high-temperature superconducting thin films by a dielectric resonator with a metal ring. After calibration, the effect of metal ring loss on measurement accuracy is negligible. The measurement resolution is determined by the internal diameter of the metal ring, which makes the design of the device more flexible. Therefore, measurement with high resolution and convenience can be achieved simultaneously by using a metal ring with proper size and operating at a relatively low frequency. A test device working at 32 GHz with TE01(1 +δ)mode was developed. Its resolution is a circular area with a diameter of 5 mm and an area of 19.6 mm2. The unloaded quality factor of the test device is more than 140,000, when it is loaded by the calibration cavity. The test device has a relative uncertainty of less than 6%, which complies with the uncertainty (20%) specified by the international standard for the microwave surface resistance measurement of high-temperature superconducting (HTS) thin film. The surface resistance distribution of a 2-in. YBCO/LAO/YBCO superconducting film sample was measured by this test device.
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