Testing incompatibility of quantum devices with few states
Testing incompatibility of quantum devices with few states
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DOI：
10.1103/physreva.104.032228
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发表时间：
2021-05
影响因子：
2.9
通讯作者：
Teiko Heinosaari;T. Miyadera;Ryo Takakura
中科院分区：
文献类型：
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作者：
Teiko Heinosaari;T. Miyadera;Ryo Takakura
当观察结果必须来自不兼容的设备，而兼容的设备不能产生时？这个问题激发了两个整数值量化的不兼容性，称为不兼容性维数和兼容性维数。第一个量化了如果仔细选择测试状态，最少需要多少状态来检测不兼容性，而第二个量化了如果随机选择，可能需要使用多少状态。通过具体的例子，我们表明，这些数量有意想不到的行为与噪声。
When observations must come from incompatible devices and cannot be produced by compatible devices? This question motivates two integer valued quantifications of incompatibility, called incompatibility dimension and compatibility dimension. The first one quantifies how many states are minimally needed to detect incompatibility if the test states are chosen carefully, whereas the second one quantifies how many states one may have to use if they are randomly chosen. With concrete examples we show that these quantities have unexpected behaviour with respect to noise.