Identification of Secondary Dislocations by Singular Value Decomposition of the Nye Tensor
Identification of Secondary Dislocations by Singular Value Decomposition of the Nye Tensor
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DOI：
10.1007/s40195-014-0123-6
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发表时间：
2014-08
期刊：
影响因子：
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通讯作者：
Fuzhi Dai;Wen-Zheng Zhang
中科院分区：
文献类型：
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作者：
Fuzhi Dai;Wen-Zheng Zhang
最近，我们提出用奈张量的奇异值和奇异向量来描述位错的特征。为了进一步验证该方法在位错识别中的有效性，本文将该算法应用于二次位错检测。与参考态为单晶的完全位错和部分位错不同，检测二次位错的参考态应该是具有重合相干态的双晶。结果表明，选择合适的参考态，可以正确地识别界面中的二次位错。
Recently, we proposed the use of singular values and singular vectors of the Nye tensor to specify the features of dislocations. To further validate the method in identifying dislocations, the algorithm is applied to detect secondary dislocations in this paper. Different from the perfect and partial dislocations where the reference state is a single crystal, the reference state for detecting secondary dislocations should be a bi-crystal in a coincident coherent state. It is demonstrated that the secondary dislocations in an interface can be correctly identified when the reference state is appropriately selected.