Practicality of compensating the loss in the plasmonic waveguides using semiconductor gain medium
Practicality of compensating the loss in the plasmonic waveguides using semiconductor gain medium
复制标题
DOI：
10.1063/1.3673849
复制
发表时间：
2012-01-02
影响因子：
4
通讯作者：
Sun, Greg
中科院分区：
文献类型：
--
作者：
Khurgin, Jacob B.;Sun, Greg
我们考虑了用半导体增益材料来补偿等离子体光波导中的损耗的问题，结果表明，在具有明显的亚波长光限制(小于波长/4N)的等离子体光波导中，完全补偿损耗与特定的几何形状无关，所需的电流密度远远超过100kA/cm(2)。这种高电流密度归因于亚波长限制固有的珀塞尔效应不可避免地缩短了复合时间。因此，注入泵浦的等离子体激光器在所有三个维度上都是真正的亚波长(“散斑”)，其阈值电流密度是任何可以想象的半导体器件都难以获得的。(C)2012年美国物理研究所。[DOI：10.1063/1.3673849]
We consider the issue of compensating the loss in plasmonic waveguides with semiconductor gain material and show that, independent of specific geometry, full loss compensation in plasmonic waveguides with significantly sub-wavelength light confinement (less than lambda/4n) requires current density well in excess of 100 kA/cm(2). This high current density is attributed to the unavoidable shortening of recombination time caused by the Purcell effect inherent to sub-wavelength confinement. Consequently, an injection-pumped plasmonic laser that is truly sub-wavelength in all three dimensions ("spaser") would have threshold current densities that are hard to obtain in any conceivable semiconductor device. (C) 2012 American Institute of Physics. [doi:10.1063/1.3673849]