The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis
The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis
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DOI：
10.1007/s10967-010-0509-5
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发表时间：
2010-03
影响因子：
1.6
通讯作者：
A. Fahey;N. Ritchie;D. Newbury;J. Small
中科院分区：
文献类型：
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作者：
A. Fahey;N. Ritchie;D. Newbury;J. Small
二次离子质谱（西姆斯），二次电子显微镜（SEM）和X射线分析已被应用到测量的U轴承颗粒的意图收集有关其历史和/或起源的信息。铅同位素丰度是含铀颗粒来自矿体的明确指标，即使它们经历了化学处理。 SEM图像和X射线分析可以为研究提供更多信息，这些信息可能暗示了化学处理的程度。 没有放射成因特征的“普通”铅的存在是人为来源的明确证据。
Secondary ion mass spectrometry (SIMS), secondary electron microscopy (SEM) and X-ray analysis have been applied to the measurement of U-bearing particles with the intent of gleaning information concerning their history and/or origin. The lead isotopic abundances are definitive indicators that U-bearing particles have come from an ore-body, even if they have undergone chemical processing. SEM images and X-ray analysis can add further information to the study that may allude to the extent of chemical processing. The presence of “common” lead that does not exhibit a radiogenic signature is clear evidence of anthropogenic origin.