Design and performance of the ABCD chip for the binary readout of silicon strip detectors in the ATLAS semiconductor tracker
Design and performance of the ABCD chip for the binary readout of silicon strip detectors in the ATLAS semiconductor tracker
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用于ATLAS半导体跟踪器中硅条探测器二进制读出的ABCD芯片的设计和性能
DOI：
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发表时间：
1999
期刊：
影响因子：
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通讯作者：
A. Zsenei
中科院分区：
文献类型：
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作者：
W. Dąbrowski;F. Anghinolfi;C. Buttar;V. Cindro;A.G. Clarks;I. Dawson;D. Dorfan;T. Dubbs;N. Falconer;M. French;A. Greenall;A. Grillo;R. Happer;P. Jarron;J. Kapłon;J. Kudłaty;G. Kramberger;C. Lacasta;D. Lamarra;D. Macina;I. Mandić;M. Mikuž;G. Meddeler;O. Milgrome;H. Niggli;P. Phillips;S. Roe;A. Smith;H. Spieler;E. Spencer;R. Szczygieł;P. Weilhammer;M. Wolter;A. Zsenei
ABCD 设计是 ATLAS 半导体跟踪器中硅条检测器二进制读出架构的单芯片实现。原型芯片已在DMILL工艺中成功制造。在本文中，我们介绍了芯片的设计和测量结果。 ABCD 设计的基本模拟性能已使用配备 ABCD 芯片的原型 SCT 模块进行了评估。数字性能已使用通用 IC 测试仪进行了评估。测量结果证实 ABCD 设计的所有模块功能齐全，并且芯片满足 SCT 的所有基本要求。
The ABCD design is a single chip implementation of the binary readout architecture for silicon strip detectors in the ATLAS semiconductor tracker. The prototype chip has been manufactured successfully in the DMILL process. In the paper we present the design of the chip and the measurement results. The basic analogue performance of the ABCD design has been evaluated using a prototype SCT module equipped with the ABCD chips. The digital performance has been evaluated using a general purpose IC tester. The measurements confirmed that all blocks of the ABCD design are fully functional and the chips meet all basic requirements of the SCT.