Optical Fourier transform based in-plane vibration characterization for MEMS comb structure.
Optical Fourier transform based in-plane vibration characterization for MEMS comb structure.
复制标题
基于光学傅里叶变换的 MEMS 梳状结构面内振动表征。
DOI:
10.1364/oe.21.005063
复制
发表时间:
2013
期刊:
影响因子:
3.8
通讯作者:
Jianzhong Yang
中科院分区:
文献类型:
--
作者:
Yongfeng Gao;Liangcai Cao;Z. You;Jiahao Zhao;Zichen Zhang;Jianzhong Yang
On-line and on-wafer characterizations of mechanical properties of Micro-Electro-Mechanical-System (MEMS) with efficiency are very important to the mass production of MEMS foundry in the near future. However, challenges still remain. In this paper, we present an in-plane vibration characterizing method for MEMS comb using optical Fourier transform (OFT). In the experiment, the intensity distribution at the focal plane was captured to characterize the displacement of the vibrator in the MEMS comb structure. A typical MEMS comb was tested to verify the principle. The shape and the movement of MEMS comb was imitated and tested to calibrate the measurement by using a spatial light modulator (SLM). The relative standard deviations (RSD) of the measured displacements were better than 5%, where the RSD is defined as the ratio of the standard deviation to the mean. It is convinced that the presented method is feasible for on-line and on-wafer characterizations for MEMS with great convenience, high efficiency and low cost.