Accurate in situ Measurement of Ellipticity Based on Subcycle Ionization Dynamics
Accurate in situ Measurement of Ellipticity Based on Subcycle Ionization Dynamics
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基于次周期电离动力学的椭圆度原位精确测量
DOI:
10.1103/physrevlett.122.013203
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发表时间:
2019
影响因子:
8.6
通讯作者:
Ding Dajun
中科院分区:
文献类型:
--
作者:
Wang Chuncheng;Li Xiaokai;Xiao Xiang Ru;Yang Yizhang;Luo Sizuo;Yu Xitao;Xu Xinpeng;Peng Liang You;Gong Qihuang;Ding Dajun
Elliptically polarized laser pulses (EPLPs) are widely applied in many fields of ultrafast sciences, but the ellipticity () has never beenin situmeasured in the interaction zone of the laser focus. In this Letter, we propose and realize a robust scheme to retrieve theby temporally overlapping two identical counterrotating EPLPs. The combined linearly electric field is coherently controlled to ionize Xe atoms by varying the phase delay between the two EPLPs. The electron spectra of the above-threshold ionization and the ion yield are sensitively modulated by the phase delay. We demonstrate that these modulations can be used to accurately determineof the EPLP. We show that the present method is highly reliable and is applicable in a wide range of laser parameters. The accurate retrieval ofoffers a better characterization of a laser pulse, promising a more delicate and quantitative control of the subcycle dynamics in many strong field processes.