Verification of topological magnetic properties of patterned ferromagnetic films
Verification of topological magnetic properties of patterned ferromagnetic films
复制标题
图案化铁磁薄膜的拓扑磁性能验证
DOI：
10.1063/5.0016672
复制
发表时间：
2020
影响因子：
4
通讯作者：
Longjiang Deng
中科院分区：
文献类型：
--
作者：
Mei Bi;Jian Xue;Le Yuan;Xin Wang;Xiaolong Weng;Longjiang Deng
磁性薄膜的拓扑有序性因其非常规的电磁输运效应而备受关注，但图案化磁性薄膜的不连续性和小型化限制了其拓扑性质的研究。本文提出了一种新的测量方法，该方法的应用提高了亚微米磁性薄膜元件电学测量的方便性。为了获得离散化的磁性织构的拓扑霍尔电阻率，将铁磁双层膜制造成特定的几何形状。微磁学模拟表明，在交换耦合图案化的铁磁薄膜的拓扑自旋分布。实验上进行的FePt/FeNi双层膜，形成与铁镍磁盘上的连续FePt膜的拓扑自旋分布的正方形阵列。在没有纳米级霍尔栅器件的情况下，在FePt/FeNi薄膜中观察到了拓扑霍尔效应。该技术为纳米尺度下的电性能测量提供了便利，为自旋电子学的应用提供了一条新的途径。
Topological order of magnetic films shows promise due to its unconventional electromagnetic transport effects, but the discontinuity and the miniaturization of patterned magnetic films impose a limit on research of topological properties. In this article, a technique is proposed, the application of which improves the ease of electrical measurement in sub-micrometer-sized magnetic thin film elements. To obtain the topological Hall resistivity of the discretized magnetic textures, a ferromagnetic bilayer film was fabricated into specific geometries. Micromagnetic simulations are presented that demonstrate the topological spin distribution in an exchange coupled patterned ferromagnetic film. Experiments are performed on FePt/FeNi bilayered films that are formed with square arrays of FeNi disks on top of a continuous FePt film in a topological spin distribution. The observation of topological Hall effect was made in the FePt/FeNi film without a nanoscale Hall-bar device. The technique presented facilitates the electrical property measurement even in nanometer elements and offers a pathway for promoting spintronics applications.