The influence of inorganic oxidants and metal ions on semiconductor sensitized photodegradation of 4-fluorophenol
The influence of inorganic oxidants and metal ions on semiconductor sensitized photodegradation of 4-fluorophenol
复制标题
DOI:
10.1016/j.cej.2006.07.016
复制
发表时间:
2007-03-15
影响因子:
15.1
通讯作者:
Swaminathan, M.
中科院分区:
文献类型:
--
作者:
Selvam, K.;Muruganandham, M.;Swaminathan, M.
This paper mainly focuses on the influence of inorganic oxidants and metal ions on the TiO2, ZnO sensitized photodegradation of 4-fluorophenol (4-FP) by UV-A light. TiO2-P25 is more efficient than ZnO. Among the oxidants periodate ion was found to be more efficient than others in improving the degradation of 4-FP via formation of reactive radicals. The effect of oxidants on the degradation of 4-FP was found to be in the order of IO4- > BrO3- > S2O82- H2O2 > ClO3-. The effect of metal ions on degradation of 4-FP was found to be in the order of Mg2+ > Fe3+ > Fe2+ > Cu2+. The degradation of 4-FP follows pseudo-first order kinetics according to the Langmuir-Hinshelwood model. The photomineralisation has also been confirmed by COD, gas chromatography and fluoride ion measurements. (c) 2006 Elsevier B.V. All rights reserved.