Routes to Probe Strain in “ZnO/ZnS Superlattice” Nanostructures by X-ray Diffraction
Routes to Probe Strain in “ZnO/ZnS Superlattice” Nanostructures by X-ray Diffraction
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DOI：
10.1021/jp4002737
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发表时间：
2013-06
影响因子：
3.7
通讯作者：
Q. Gao;Jing Wen;Xin Liu;Lili Wu;Hong Gao;Xitian Zhang
中科院分区：
文献类型：
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作者：
Q. Gao;Jing Wen;Xin Liu;Lili Wu;Hong Gao;Xitian Zhang
采用化学气相沉积法合成了“ZnO/ZnS超晶格”纳米结构。ZnO和ZnS之间的晶格失配在薄超晶格内诱导缺陷以及在界面（结）处的变形，这可能导致应变的出现。X射线衍射（XRD）对晶格参数的微小变化很敏感。根据XRD图谱，分别得到了ZnO/ZnS超晶格纳米结构和应变的ZnO和ZnS的晶格常数。这些数据与高分辨率透射电子显微镜图像的观察结果一致。
“ZnO/ZnS superlattice” nanostructures were synthesized via a chemical vapor deposition process. The lattice mismatch between ZnO and ZnS induced defects within the thin superlattice as well as deformations at the interface (junction), which could result in the appearance of strain. X-ray diffraction (XRD) is sensitive to very small changes of lattice parameters. The lattice constants of ZnO and ZnS for the “ZnO/ZnS superlattice” nanostructures and strains were obtained, respectively, on the basis of the XRD pattern. These data are consistent with the observation of high-resolution transmission electron microscopy images.