Structure of Latent Tracks Created by Swift Heavy Ions in Amorphous SiO2 and Zinc Phosphate Glass
Structure of Latent Tracks Created by Swift Heavy Ions in Amorphous SiO2 and Zinc Phosphate Glass
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无定形 SiO2 和磷酸锌玻璃中快速重离子产生的潜迹结构
DOI：
10.1143/jjap.42.3950
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发表时间：
2003
影响因子：
1.5
通讯作者：
K. Shima
中科院分区：
文献类型：
--
作者：
K. Awazu;S. Roorda;J. Brebner;S. Ishii;K. Shima
研究了快速重离子辐照在无定形SiO2和磷酸锌玻璃（68P2O5:25ZnO:4.5Al2O3:2.5Na2O）上产生的潜迹结构。在非晶SiO2中，Si-O不对称拉伸振动的红外吸收频率随着辐照而降低。发现这种红外峰移与SiO4四面体正六元环向平面三元环的转变有关。潜迹的高蚀刻率与平面三元环密切相关。在离子辐照的磷酸锌玻璃中，两个桥接氧原子与一个磷原子结合，变成一个桥接氧原子。未观察到Zn-O键断裂。结果表明，磷酸锌玻璃中潜迹的高蚀刻速率与P-O键断裂有关。
The structure of latent tracks introduced by swift-heavy-ion irradiation was examined on both amorphous SiO2 and zinc phosphate glass (68P2O5:25ZnO:4.5Al2O3:2.5Na2O). In amorphous SiO2, the frequency of the infrared absorption assigned to the asymmetric stretching vibration of Si–O decreased with irradiation. This IR peak shift has been found to be related to the transition of normal six-membered rings of SiO4 tetrahedra to planar three-membered rings. The high etching rate of the latent tracks is strongly related to planar three-membered rings. In the ion-irradiated zinc phosphate glass, two bridging oxygen atoms bound to a phosphorus atom turned into one bridging oxygen atom. Scission of the Zn–O bond was not observed. It was concluded that the high etching rate of the latent tracks in zinc–phosphate glass is related to P–O bond scission.