Vacuum Ultraviolet Spectrum of Neutral Silicon
Vacuum Ultraviolet Spectrum of Neutral Silicon
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DOI：
10.1364/josa.56.000911
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发表时间：
1966-07
影响因子：
--
通讯作者：
V. Kaufman;L. J. Radziemski;K. L. Andrew
中科院分区：
文献类型：
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作者：
V. Kaufman;L. J. Radziemski;K. L. Andrew
对由低压源激发的 1548 至 2000 A 区域内的约 200 个 Si i 谱线进行了测量，得到的波长值平均不确定度小于 0.0015 A。在这些真空紫外波长中，Radziemski 和 Andrew 计算出了 88 个波长 [J. Opt.苏克。 Am.55, 474 ( 1965)]，测量值和计算值的比较给出了 0.0008 A 的平均偏差。差异图显示分散度远大于任何系统差异。这表明计算出的波长与用作测量 Si i 线的标准的 Ge i 线组兼容。新数据还导致了奇数级分析的扩展和轻微修改。还报告了一些 C i、Ge ii、Ni 和 Si ii 谱线的新测量结果。光谱图是在 10.7 米 Eagle 真空光谱仪上以 0.78 A/mm 的倒易色散拍摄的。光源是含有 SiCl4 和 GeCl4 蒸气的无电极放电灯，载气为氩气或氦气，总压不大于 0.5 托。
Measurements have been made on about 200 Si i lines in the region 1548 to 2000 A excited by a low-pressure source, resulting in wavelength values with uncertainties of less than 0.0015 A on the average. Of these vacuum ultraviolet wavelengths, 88 have been calculated by Radziemski and Andrew [ J. Opt. Soc. Am.55, 474 ( 1965)], and a comparison of measured and calculated values gives an average deviation of 0.0008 A. A plot of the differences shows the scatter to be much greater than any systematic difference. This indicates that the calculated wavelengths are compatible with the set of Ge i lines used as standards in measuring the Si i lines. The new data have also led to an extension and a slight revision of the odd-level analysis. New measurements on some lines of C i, Ge ii, N i, and Si ii are also reported. Spectrograms were taken in the first order on a 10.7-m Eagle vacuum spectrograph with a reciprocal dispersion of 0.78 A/mm. The source was an electrodeless discharge lamp containing SiCl4 and GeCl4 vapor with argon or helium carrier gas at a total pressure no greater than 0.5 torr.